S. Chongsawangvirod

Statistics

Publications

Citations

180

H-Index

Active since

1990

Affiliations

University of North Carolina at Chapel Hill(Current)

Nortel (Canada)

S. Chongsawangvirod is an author at University of North Carolina at Chapel Hill specializing in natural sciences, materials science, and materials engineering.

Publications per year

1990–1992

Publications

Measurements and Modeling of Thin Silicon Dioxide Films on Silicon

A. Kalnitsky, Sing-Pin Tay, J. P. Ellul et al. · Journal of The Electrochemical Society · 1990 · 70 citations

Natural Sciences, Materials Engineering, Materials Science +17

Spectroscopic ellipsometric measurements of the dielectric function of germanium dioxide films on crystal germanium

Yi Hu, J.‐T. Zettler, S. Chongsawangvirod et al. · Applied Physics Letters · 1992 · 38 citations

Natural Sciences, Materials Science, Physics +15

Refractive Index Profiles of Thermally Grown and Chemically Vapor Deposited Films on Silicon

S. Chongsawangvirod, E. A. Irene, A. Kalnitsky et al. · Journal of The Electrochemical Society · 1990 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17

A comparison of the measurement of ion damage in silicon surfaces using differential reflectance and spectroscopic ellipsometry

T. M. Burns, S. Chongsawangvirod, J.W. Andrews et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +16

In Situ Differential Reflectance Study of the Etching of SiO2 Films

Uean‐Sin Pahk, S. Chongsawangvirod, E. A. Irene · Journal of The Electrochemical Society · 1991 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +17

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