Anastasiia Kruv

Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress

Kookjin Lee, B. Kaczer, Anastasiia Kruv et al. · IEEE Electron Device Letters · 2021 · 18 citations

Engineering, Electrical Engineering, Finite Element Analysis +16

A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication

Anastasiia Kruv, Mireia Bargalló González, Oguzhan Orkut Okudur et al. · Microelectronic Engineering · 2021 · 18 citations

Engineering, Computer Engineering, Materials Science +13

Impact of Mechanical Stress on the Electrical Performance of 3D NAND

Anastasiia Kruv, A. Arreghini, Mireia Bargalló González et al. · 2019 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of mechanical strain on wakeup of HfO2 ferroelectric memory

Anastasiia Kruv, S. R. C. McMitchell, Sergiu Clima et al. · 2021 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +17

Impact of Mechanical Stress on 3-D NAND Flash Current Conduction

Anastasiia Kruv, A. Arreghini, Devin Verreck et al. · IEEE Transactions on Electron Devices · 2020 · 14 citations · Full text

Natural Sciences, Electrical Engineering, Materials Science +14