J. Heindl

Doping of SiC by Implantation of Boron and Aluminum

T. Troffer, M. Schadt, Thomas Frank et al. · physica status solidi (a) · 1997 · 294 citations

Engineering, Materials Engineering, Materials Science +17

Micropipes: Hollow Tubes in Silicon Carbide

J. Heindl, H. P. Strunk, V.D. Heydemann et al. · physica status solidi (a) · 1997 · 87 citations

Natural Sciences, Materials Engineering, Materials Science +7

Dislocation Content of Micropipes in SiC

J. Heindl, W. Dorsch, H. P. Strunk et al. · Physical Review Letters · 1998 · 73 citations

Natural Sciences, Materials Engineering, Materials Science +17

Damage production and annealing of ion implanted silicon carbide

A. Heft, E. Wendler, J. Heindl et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1996 · 43 citations

Engineering, Materials Engineering, Materials Science +13

Investigation of radiation damage in ion implanted and annealed SiC layers

W. Wesch, A. Heft, J. Heindl et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 31 citations

Engineering, Materials Engineering, Materials Science +12