J. Heindl

Doping of SiC by Implantation of Boron and Aluminum

T. Troffer, M. Schadt, Thomas Frank et al. · physica status solidi (a) · 1997 · 291 citations

Materials Engineering, Materials Science, Electrical Engineering +11

Micropipes: Hollow Tubes in Silicon Carbide

J. Heindl, H. P. Strunk, V.D. Heydemann et al. · physica status solidi (a) · 1997 · 87 citations

Materials Science, Engineering, Microfabrication +11

Dislocation Content of Micropipes in SiC

J. Heindl, W. Dorsch, H. P. Strunk et al. · Physical Review Letters · 1998 · 72 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +18

Damage production and annealing of ion implanted silicon carbide

A. Heft, E. Wendler, J. Heindl et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1996 · 42 citations

Materials Science, Materials Engineering, Electrical Engineering +7

Investigation of radiation damage in ion implanted and annealed SiC layers

W. Wesch, A. Heft, J. Heindl et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 31 citations

Materials Science, Ion Implantation, Engineering +5