G. Sery

Life is CMOS

G. Sery, Shekhar Borkar, Vivek De · Proceedings - ACM IEEE Design Automation Conference · 2002 · 102 citations

Low-power Electronics, Electrical Engineering, Engineering +13

A scaling methodology for oxide-nitride-oxide interpoly dielectric for EPROM applications

C.-S. Pan, Kai-Bin Wu, Phil Freiberger et al. · IEEE Transactions on Electron Devices · 1990 · 35 citations

Non-volatile Memory, Scaling Scheme, Engineering +17

A model for EPROM intrinsic charge loss through oxide-nitride-oxide (ONO) interpoly dielectric

Kai-Bin Wu, C.-S. Pan, Jerry Shaw et al. · 2002 · 31 citations

Materials Science, Interpoly Dielectric, Electronic Materials +14

Physical origin of long-term charge loss in floating-gate EPROM with an interpoly oxide-nitride-oxide stacked dielectric

C.-S. Pan, Kai-Bin Wu, G. Sery · IEEE Electron Device Letters · 1991 · 27 citations

Engineering, Physical Origin, Charge Transport +17

High-temperature charge loss mechanism in a floating-gate EPROM with an oxide-nitride-oxide (ONO) interpoly stacked dielectric

C.-S. Pan, Kai-Bin Wu, D. Chin et al. · IEEE Electron Device Letters · 1991 · 18 citations

Engineering, Charge Transport, Semiconductor Device +17