Kai-Bin Wu

Key differences for process-induced uniaxial vs. substrate-induced biaxial stressed Si and Ge channel MOSFETs

Scott E. Thompson, Guangyu Sun, Kai-Bin Wu et al. · 2005 · 146 citations

Materials Engineering, Uniaxial Stressed P-mosfets, Electrical Engineering +14

Delaunay–Voronoi Modeling of Power-Ground Planes With Source Port Correction

Kai-Bin Wu, Guang-Hwa Shiue, Wei-Da Guo et al. · IEEE Transactions on Advanced Packaging · 2008 · 46 citations

Engineering, Power Electronics, Source Port Correction +18

A scaling methodology for oxide-nitride-oxide interpoly dielectric for EPROM applications

C.-S. Pan, Kai-Bin Wu, Phil Freiberger et al. · IEEE Transactions on Electron Devices · 1990 · 35 citations

Non-volatile Memory, Scaling Scheme, Engineering +17

A model for EPROM intrinsic charge loss through oxide-nitride-oxide (ONO) interpoly dielectric

Kai-Bin Wu, C.-S. Pan, Jerry Shaw et al. · 2002 · 31 citations

Materials Science, Interpoly Dielectric, Electronic Materials +14

Optimization for the Locations of Decoupling Capacitors in Suppressing the Ground Bounce by Genetic Algorithm

Kai-Bin Wu, Gus-Hwa Shiue, Ruey‐Beei Wu · PIERS Online · 2005 · 29 citations

Electrical Engineering, Engineering, Mixed-signal Integrated Circuit +6