J.J. Tzou

Study of the atomic models of three donor-like traps on oxidized silicon with aluminum gate from their processing dependences

Chih‐Tang Sah, J.Y.-C. Sun, J.J. Tzou · Journal of Applied Physics · 1983 · 91 citations

Engineering, Aluminum Gate, Chemistry +20

Hot-carrier-induced degradation in p-channel LDD MOSFET's

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1986 · 48 citations

Device Modeling, Electrical Engineering, Engineering +13

Field dependence of two large hole capture cross sections in thermal oxide on silicon

J.J. Tzou, Jack Yuan-Chen Sun, Chih‐Tang Sah · Applied Physics Letters · 1983 · 48 citations

Field Dependence, Engineering, Physics +12

Hot-electron-induced MOSFET degradation at low temperatures

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1985 · 45 citations

Smaller Proportionality, Electrical Engineering, Engineering +7

Deactivation of group III acceptors in silicon during keV electron irradiation

Chih‐Tang Sah, Jack Yuan-Chen Sun, J.J. Tzou et al. · Applied Physics Letters · 1983 · 41 citations

Engineering, Silicon On Insulator, Semiconductor Device +16