R. Cheung

Hot-carrier-induced degradation in p-channel LDD MOSFET's

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1986 · 48 citations

Device Modeling, Electrical Engineering, Engineering +13

Hot-electron-induced MOSFET degradation at low temperatures

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1985 · 45 citations

Smaller Proportionality, Electrical Engineering, Engineering +7

Temperature dependence of charge generation and breakdown in SiO₂

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1986 · 39 citations

Experimental Results, Electrical Engineering, Positive Charges +11

The temperature dependence of threshold voltages in submicrometer CMOS

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1985 · 27 citations

Low-power Electronics, Electrical Engineering, Long Buried-p-channel Mosfet +10

Structure and Frequency Dependence of Hot-Carrier-Induced Degradation in CMOS VLSI

C.C. Yao, J.J. Tzou, R. Cheung et al. · 1987 · 12 citations

Electrical Engineering, Engineering, Vlsi Design +14