C.C. Yao

Hot-carrier-induced degradation in p-channel LDD MOSFET's

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1986 · 48 citations

Device Modeling, Electrical Engineering, Engineering +13

Hot-electron-induced MOSFET degradation at low temperatures

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1985 · 45 citations

Smaller Proportionality, Electrical Engineering, Engineering +7

Temperature dependence of charge generation and breakdown in SiO₂

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1986 · 39 citations

Experimental Results, Electrical Engineering, Positive Charges +11

The temperature dependence of threshold voltages in submicrometer CMOS

J.J. Tzou, C.C. Yao, R. Cheung et al. · IEEE Electron Device Letters · 1985 · 27 citations

Low-power Electronics, Electrical Engineering, Long Buried-p-channel Mosfet +10

Monolithic Integration of a Dielectric Millimeter-Wave Antenna and Mixer Diode: An Embryonic Millimeter-Wave IC

C.C. Yao, S. E. Schwarz, B.J. Blumenstock · IEEE Transactions on Microwave Theory and Techniques · 1982 · 20 citations

Electrical Engineering, Millimeter Wave Technology, Engineering +13