J. Thomas

BTI reliability of 45 nm high-K + metal-gate process technology

Sangwoo Pae, M. Agostinelli, M. Brazier et al. · 2008 · 130 citations

Materials Engineering, Nmos Bti, Electrical Engineering +13

Self-heat reliability considerations on Intel's 22nm Tri-Gate technology

C. Prasad, Lei Jiang, D. Singh et al. · 2013 · 84 citations

Engineering, Self-heat Reliability Considerations, Computer Architecture +16

Gate dielectric TDDB characterizations of advanced High-k and metal-gate CMOS logic transistor technology

Sangwoo Pae, C. Prasad, S. Ramey et al. · 2012 · 18 citations

Electrical Engineering, Engineering, Vlsi Design +12

Effect of package design and layout on BGA solder joint reliability of an organic C4 package

B. Chandran, Deepak Goyal, J. Thomas · 2002 · 15 citations

Engineering, Mechanical Engineering, Reliability Engineering +20