S. Ramey

A 22nm high performance and low-power CMOS technology featuring fully-depleted tri-gate transistors, self-aligned contacts and high density MIM capacitors

C. Auth, C. Allen, A. Blattner et al. · 2012 · 758 citations

Engineering, Computer Engineering, Electrical Engineering +16

Intrinsic transistor reliability improvements from 22nm tri-gate technology

S. Ramey, A. Ashutosh, C. Auth et al. · 2013 · 167 citations

Engineering, Electrical Engineering, Electronic Materials +15

BTI reliability of 45 nm high-K + metal-gate process technology

Sangwoo Pae, M. Agostinelli, M. Brazier et al. · 2008 · 131 citations

Engineering, Electrical Engineering, Materials Science +17

Self-heat reliability considerations on Intel's 22nm Tri-Gate technology

C. Prasad, Lei Jiang, D. Singh et al. · 2013 · 84 citations

Engineering, Computer Engineering, Electrical Engineering +17

Modeling of multiple-quantum-well solar cells including capture, escape, and recombination of photoexcited carriers in quantum wells

S. Ramey, Rahim Khoie · IEEE Transactions on Electron Devices · 2003 · 82 citations

Engineering, Electrical Engineering, Materials Science +17