High-mobility thin-film transistor with amorphous InGaZnO4 channel fabricated by room temperature rf-magnetron sputtering

Hisato Yabuta, Masafumi Sano, Katsumi Abe, +6

Applied Physics Letters

EngineeringThin Film Process TechnologyAmorphous Ingazno4 ChannelSemiconductor DeviceSemiconductors +15

Mobility–stability trade-off in oxide thin-film transistors

Yu‐Shien Shiah, Kihyung Sim, Yuhao Shi, +5

Nature Electronics

Electrical EngineeringEngineeringOxide ElectronicsApplied PhysicsThin Films +1

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

Tze-Ching Fung, Chiao-Shun Chuang, Katsumi Abe, +4

Journal of Applied Physics

Materials ScienceOxygen VacancyElectrical EngineeringElectronic DevicesEngineering +13

Amorphous In–Ga–Zn–O coplanar homojunction thin-film transistor

Ayumu Sato, Katsumi Abe, Ryo Hayashi, +5

Applied Physics Letters

Materials ScienceSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineering +11

Density of States of a-InGaZnO From Temperature-Dependent Field-Effect Studies

Katsumi Abe, Hideya Kumomi, Jerzy Kanicki

IEEE Transactions on Electron Devices

EngineeringThin Film Process TechnologySemiconductor DeviceElectronic DevicesTft Drain +15

Circuits using uniform TFTs based on amorphous In‐Ga‐Zn‐O

Ryo Hayashi, Masato Ofuji, Nobuyuki Kaji, +9

Journal of the Society for Information Display

EngineeringOrganic ElectronicsUniform TftsOptoelectronic DevicesIntegrated Circuits +15

Preparation and properties of GeGaS glasses for laser hosts

Katsumi Abe, Hiromichi Takebe, Kenji Morinaga

Journal of Non-Crystalline Solids

Fast Thin-Film Transistor Circuits Based on Amorphous Oxide Semiconductor

Masato Ofuji, Katsumi Abe, Hisae O. Shimizu, +7

IEEE Electron Device Letters

Electrical EngineeringEngineeringNanoelectronicsElectronic EngineeringThin-film Transistor Circuits +9

Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors

Tze-Ching Fung, Katsumi Abe, Hideya Kumomi, +1

Journal of Display Technology

SemiconductorsStress VoltageElectrical EngineeringNegative Voltage ShiftEngineering +11

Electrical Properties and Stability of Dual-Gate Coplanar Homojunction DC Sputtered Amorphous Indium–Gallium–Zinc–Oxide Thin-Film Transistors and Its Application to AM-OLEDs

Gwanghyeon Baek, Katsumi Abe, Alex Kuo, +2

IEEE Transactions on Electron Devices

EngineeringOrganic ElectronicsBottom GateThin Film Process TechnologyElectrical Properties +15