Mobility–stability trade-off in oxide thin-film transistors

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Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

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Surface chemistry of electrodeposited Cu2O films studied by XPS

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Effects of excess oxygen on operation characteristics of amorphous In-Ga-Zn-O thin-film transistors

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Photo-bias instability of metal oxide thin film transistors for advanced active matrix displays

Jae Kyeong Jeong · Journal of materials research/Pratt's guide to venture capital sources · 2013 · 205 citations

Engineering, Electrical Engineering, Materials Science +15