S. S. Mani

Interface trap profile near the band edges at the 4H-SiC/SiO2 interface

N. S. Saks, S. S. Mani, Anant Agarwal · Applied Physics Letters · 2000 · 178 citations

Engineering, Electrical Engineering, Materials Science +17

Sintering time and atmosphere influences on the microstructure and mechanical properties of tungsten heavy alloys

Randall M. German, A. Bose, S. S. Mani · Metallurgical Transactions A · 1992 · 109 citations

Natural Sciences, Materials Engineering, Materials Science +13

A 475-V high-voltage 6H-SiC lateral MOSFET

N. S. Saks, S. S. Mani, Anant Agarwal et al. · IEEE Electron Device Letters · 1999 · 28 citations

Engineering, Electrical Engineering, Materials Science +17

Selective W for Coating and Releasing MEMS Devices

S. S. Mani, J. G. Fleming, J.J. Sniegowski et al. · MRS Proceedings · 1999 · 28 citations · Full text

Engineering, Materials Engineering, Materials Science +11

Micromechanical testing of MEMS materials

Thomas Edward Buchheit, S. Jill Glass, John Sullivan et al. · Journal of Materials Science · 2003 · 22 citations

Engineering, Materials Science, Mechanical Engineering +13