D. Pawlik

Benchmarking and improving III-V Esaki diode performance with a record 2.2 MA/cm<sup>2</sup> peak current density to enhance TFET drive current

D. Pawlik, Brian Romanczyk, Paul M. Thomas et al. · 2012 · 31 citations

Semiconductors, Td Performance, Electrical Engineering +12

Full band atomistic modeling of homo-junction InGaAs band-to-band tunneling diodes including band gap narrowing

Woo-Suhl Cho, Mathieu Luisier, D. K. Mohata et al. · Applied Physics Letters · 2012 · 25 citations

Categoryquantum Electronics, Engineering, Band Gap +16

Benchmarking current density in staggered gap In0.53Ga0.47As/GaAs0.5Sb0.5 heterojunction Esaki tunnel diodes

Brian Romanczyk, Paul M. Thomas, D. Pawlik et al. · Applied Physics Letters · 2013 · 20 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

Record PVCR GaAs-based tunnel diodes fabricated on Si substrates using aspect ratio trapping

S.L. Rommel, D. Pawlik, Paul M. Thomas et al. · 2008 · 18 citations

Engineering, Optoelectronic Devices, Semiconductor Device +18

Mapping Defect Density in MBE Grown <inline-formula> <tex-math notation="TeX">${\rm In}_{0.53}{\rm Ga}_{0.47}{\rm As}$ </tex-math></inline-formula> Epitaxial Layers on Si Substrate Using Esaki Diode Valley Characteristics

Kausik Majumdar, Paul M. Thomas, Wei-Yip Loh et al. · IEEE Transactions on Electron Devices · 2014 · 13 citations

Engineering, Integrated Circuits, Excess Defect Density +16