K. van der Zanden

Metamorphic InGaAs/InAlAs quantum well structures grown on GaAs substrates for high electron mobility transistor applications

M. Behet, K. van der Zanden, G. Borghs et al. · Applied Physics Letters · 1998 · 51 citations

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +11

Root Cause of Charge Loss in a Nitride-Based Localized Trapping Memory Cell

A. Furnémont, M. Rosmeulen, K. van der Zanden et al. · IEEE Transactions on Electron Devices · 2007 · 30 citations

Non-volatile Memory, Electrical Engineering, Charge Loss +13

On the correlation between drain-gate breakdown voltage and hot-electron reliability in InP HEMTs

R. Menozzi, M. Borgarino, K. van der Zanden et al. · IEEE Electron Device Letters · 1999 · 23 citations · Full text

Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory

B. Govoreanu, D. Wellekens, L. Haspeslagh et al. · Solid-State Electronics · 2008 · 18 citations

Non-volatile Memory, Electrical Engineering, Engineering +8

Deterioration estimation of paintings by means of combined 3D and hyperspectral data analysis

Luís Granero-Montagud, Cristina Portalés, Begoña Pastor-Carbonell et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 17 citations

Engineering, Chemical Composition, Multispectral Imaging +17