Charles N. Arutt

Total Ionizing Dose Radiation Effects on 14 nm FinFET and SOI UTBB Technologies

H.L. Hughes, P. J. McMarr, Michael L. Alles et al. · 2015 · 53 citations · Full text

Engineering, Silicon On Insulator, Semiconductor Device +16

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Charles N. Arutt, Michael L. Alles, Wenjun Liao et al. · Semiconductor Science and Technology · 2016 · 35 citations

Molybdenum Disulfide, Engineering, Nanosheet +22

X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices

Pengfei Wang, En Xia Zhang, Kai-Hsin Chuang et al. · IEEE Transactions on Nuclear Science · 2018 · 17 citations · Full text

Low-power Electronics, Electrical Engineering, Unclonable Function +15

Proton Irradiation as a Screen for Displacement-Damage Sensitivity in Bipolar Junction Transistors

Charles N. Arutt, Kevin M. Warren, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2015 · 12 citations

Device Modeling, Electrical Engineering, Ion Implantation +14