Kai-Hsin Chuang

A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS

Kai-Hsin Chuang, E. Bury, R. Degraeve et al. · IEEE Journal of Solid-State Circuits · 2019 · 74 citations · Full text

Self-heating-aware CMOS reliability characterization using degradation maps

E. Bury, Adrian Chasin, B. Kaczer et al. · 2018 · 23 citations

Hardware Security, Reliability, Electrical Engineering +15

Physically unclonable function using CMOS breakdown position

Kai-Hsin Chuang, E. Bury, R. Degraeve et al. · 2017 · 20 citations · Full text

Hardware Security, Electrical Engineering, Cmos Breakdown Position +15

A multi-bit/cell PUF using analog breakdown positions in CMOS

Kai-Hsin Chuang, E. Bury, R. Degraeve et al. · 2018 · 18 citations · Full text

Hardware Security, Readout Window, Electrical Engineering +13

Statistical assessment of the full V<inf>G</inf>/V<inf>D</inf> degradation space using dedicated device arrays

E. Bury, B. Kaczer, Kai-Hsin Chuang et al. · 2017 · 17 citations

Engineering, Measurement, Computer Architecture +19