Craig Alexander

Random-Dopant-Induced Drain Current Variation in Nano-MOSFETs: A Three-Dimensional Self-Consistent Monte Carlo Simulation Study Using “<i>Ab Initio</i>” Ionized Impurity Scattering

Craig Alexander, Gareth Roy, A. Asenov · IEEE Transactions on Electron Devices · 2008 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +17

Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization

Asen Asenov, B. Cheng, Xingsheng Wang et al. · IEEE Transactions on Electron Devices · 2014 · 66 citations

Engineering, Computer Engineering, Design +17

Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques

Asen Asenov, A. R. Brown, Gareth Roy et al. · Journal of Computational Electronics · 2009 · 64 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of Self-Heating on the Statistical Variability in Bulk and SOI FinFETs

Liping Wang, A. R. Brown, Mihail Nedjalkov et al. · IEEE Transactions on Electron Devices · 2015 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +17

Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asen Asenov, S. Roy, Richard Brown et al. · 2008 · 36 citations · Full text

Engineering, Electrical Engineering, Physics +17