Ming‐Chin Hung

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 184 citations

Engineering, Electrical Engineering, Materials Science +17

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

Chih-Tsung Tsai, Ting‐Chang Chang, Shih-Ching Chen et al. · Applied Physics Letters · 2010 · 171 citations

Engineering, Electrical Engineering, Materials Science +17

Fine Tuning the Purity of Blue Emission from Polydioctylfluorene by End-Capping with Electron-Deficient Moieties

Ming‐Chin Hung, Jin-Long Liao, Show‐An Chen et al. · Journal of the American Chemical Society · 2005 · 140 citations

Natural Sciences, Chemistry, Materials Science +17

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2010 · 106 citations

Engineering, Materials Engineering, Materials Science +17

Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

Sheng-Yao Huang, Ting‐Chang Chang, Min-Chen Chen et al. · Electrochemical and Solid-State Letters · 2011 · 76 citations

Engineering, Electrical Engineering, Materials Science +17