Vincent McCaffrey

Conductive-bridge memory (CBRAM) with excellent high-temperature retention

John R. Jameson, Paul T. Blanchard, Chiyu Cheng et al. · 2013 · 74 citations

Natural Sciences, Materials Science, Physics +15

Noise-Induced Resistance Broadening in Resistive Switching Memory—Part II: Array Statistics

Stefano Ambrogio, Simone Balatti, Vincent McCaffrey et al. · IEEE Transactions on Electron Devices · 2015 · 69 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Noise-Induced Resistance Broadening in Resistive Switching Memory—Part I: Intrinsic Cell Behavior

Stefano Ambrogio, Simone Balatti, Vincent McCaffrey et al. · IEEE Transactions on Electron Devices · 2015 · 50 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of low-frequency noise on read distributions of resistive switching memory (RRAM)

Stefano Ambrogio, Simone Balatti, Vincent McCaffrey et al. · 2014 · 31 citations

Engineering, Electrical Engineering, Physics +17