Chien Chiang

X-ray diffraction determination of the effect of various passivations on stress in metal films and patterned lines

Paul A. Flinn, Chien Chiang · Journal of Applied Physics · 1990 · 167 citations

Engineering, Severe Plastic Deformation, Various Passivations +24

Diffusion of copper through dielectric films under bias temperature stress

G. Raghavan, Chien Chiang, Paul B. Anders et al. · Thin Solid Films · 1995 · 153 citations

Materials Science, Electrical Engineering, Electromigration Technique +9

New insight into hot-electron-induced degradation of n-MOSFETs

T.Y. Chan, Chien Chiang, Henry T. Gaw · 2003 · 27 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +13

Cracking behavior of xerogel silica films on silicon substrates

Loren A. Chow, Yuhuan Xu, Bruce Dunn et al. · Applied Physics Letters · 1998 · 23 citations

Engineering, Film Cracking, Silicon On Insulator +17

Mechanical properties of xerogel silica films derived from stress versus temperature and cracking experiments

Loren A. Chow, Bruce Dunn, K. N. Tu et al. · Journal of Applied Physics · 2000 · 22 citations

Engineering, Mechanical Engineering, Soft Matter +20