G. Raghavan

Diffusion of copper through dielectric films under bias temperature stress

G. Raghavan, Chien Chiang, Paul B. Anders et al. · Thin Solid Films · 1995 · 154 citations

Natural Sciences, Materials Engineering, Materials Science +14

Modifying the nanocrystalline characteristics—structure, size, and surface states of copper oxide thin films by high-energy heavy-ion irradiation

B. Balamurugan, B. R. Mehta, D.K. Avasthi et al. · Journal of Applied Physics · 2002 · 123 citations

Natural Sciences, Materials Engineering, Materials Science +16

A 3.2-GHz second-order delta-sigma modulator implemented in InP HBT technology

J.F. Jensen, G. Raghavan, A.E. Cosand et al. · IEEE Journal of Solid-State Circuits · 1995 · 123 citations

Engineering, Electrical Engineering, Microelectronics +15

Crystalline to amorphous transition and band structure evolution in ion-damaged silicon studied by spectroscopic ellipsometry

P. K. Giri, S. Tripurasundari, G. Raghavan et al. · Journal of Applied Physics · 2001 · 41 citations

Natural Sciences, Materials Science, Physics +17

Architecture, design, and test of continuous-time tunable intermediate-frequency bandpass delta-sigma modulators

G. Raghavan, J.F. Jensen, J. Laskowski et al. · IEEE Journal of Solid-State Circuits · 2001 · 40 citations

Engineering, Electrical Engineering, Analog Electronics +16