Publication | Closed Access
Diffusion of copper through dielectric films under bias temperature stress
153
Citations
6
References
1995
Year
Materials ScienceElectrical EngineeringElectromigration TechniqueDielectric FilmsEngineeringDiffusion ResistanceSurface ScienceApplied PhysicsElectronic PackagingElectrical PropertyThin Film ProcessingElectrical Insulation
| Year | Citations | |
|---|---|---|
Page 1
Page 1