X. Perpiñà

A Survey of Wide Bandgap Power Semiconductor Devices

José del R. Millán, Philippe Godignon, X. Perpiñà et al. · IEEE Transactions on Power Electronics · 2013 · 2.5K citations

Engineering, Electrical Engineering, Materials Science +17

Gate Oxide Degradation of SiC MOSFET in Switching Conditions

Rémy Ouaida, Maxime Berthou, Javier León et al. · IEEE Electron Device Letters · 2014 · 133 citations

Engineering, Electrical Engineering, Materials Engineering +17

Thermomechanical Assessment of Die-Attach Materials for Wide Bandgap Semiconductor Devices and Harsh Environment Applications

Luis A. Navarro, X. Perpiñà, Philippe Godignon et al. · IEEE Transactions on Power Electronics · 2013 · 106 citations · Full text

Engineering, Materials Engineering, Materials Science +17

SiC Schottky Diodes for Harsh Environment Space Applications

Philippe Godignon, X. Jordà, X. Perpiñà et al. · IEEE Transactions on Industrial Electronics · 2010 · 104 citations

Engineering, Electrical Engineering, Materials Science +17

Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current

X. Perpiñà, J.F. Servière, J. M. Saiz et al. · Microelectronics Reliability · 2006 · 102 citations

Engineering, Electrical Engineering, Electronic Materials +16