Rémy Ouaida

Gate Oxide Degradation of SiC MOSFET in Switching Conditions

Rémy Ouaida, Maxime Berthou, Javier León et al. · IEEE Electron Device Letters · 2014 · 131 citations

Reliability, Sic Mosfet, Electrical Engineering +15

Thermal Stability of Silicon Carbide Power JFETs

Cyril Buttay, Rémy Ouaida, Hervé Morel et al. · IEEE Transactions on Electron Devices · 2013 · 15 citations · Full text

Electrical Engineering, Engineering, Power Device +14

Electrical performances and reliability of commercial SiC MOSFETs at high temperature and in SC conditions

Maxime Berthou, Rémy Ouaida, Chailloux Thibault et al. · 2015 · 14 citations

Various Configuration, Electrical Engineering, Commercial Sic Mosfets +14

Evaluation of Novel Hybrid Protection Based on Pyroswitch and Fuse Technologies

Tomokazu Sakuraba, Rémy Ouaida, Song Chen et al. · 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) · 2018 · 14 citations

Evolution of Electrical Performance in New Generation of SiC MOSFET for High Temperature Applications

Rémy Ouaida, Cyril Calvez, Anne-Sophie Podlejski et al. · 2014 · 13 citations

Sic Mosfet, Electrical Engineering, Engineering +8