G. Pailloncy - Concepedia

Author

G. Pailloncy

Institut d'électronique de microélectronique et de nanotechnologie ORCID

Also Known As

B. Iniguez, G. Pailloncy, Guillaume Pailloncy, Pailloncy, G., Pailloncy, Guillaume

Publications

422

Citations

H-Index

Concepts

All Affiliations

Institut d'électronique de microélectronique et de nanotechnologie UCLouvain KU Leuven Farran Technology (Ireland)University of Warwick

About

G. Pailloncy is an author at Institut d'électronique de microélectronique et de nanotechnologie specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	14	320
2	Electrical Engineering	11	13	304
3	Applied Physics	7	7	150
4	Education	3	3	64
5	Computer Engineering	1	1	23

G. Pailloncy

Publications

348

Citations

H-Index

Page 1

	Year	Citations
High-Frequency Noise Performance of 60-nm Gate-Length FinFETs Jean‐Pierre Raskin, G. Pailloncy, Dimitri Lederer, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringRf Noise ParametersRadio FrequencyHigh-frequency Device	2008	55
Noise modeling in fully depleted SOI MOSFETs G. Pailloncy, G. Dambrine, J.P. Raskin, Solid-State Electronics Device ModelingElectrical EngineeringEngineeringBias Temperature InstabilityNoise	2004	34
High-Frequency and Noise Performances of 65-nm MOSFET at Liquid Nitrogen Temperature Alexandre Siligaris, G. Pailloncy, S. Delcourt, IEEE Transactions on Electron Devices Low-power ElectronicsNoise PerformancesElectrical EngineeringElectrical SimulationsEngineering	2006	32
Impact of Downscaling on High-Frequency Noise Performance of Bulk and SOI MOSFETs G. Pailloncy, F. Danneville, G. Dambrine IEEE Transactions on Electron Devices	2004	28
Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk Valeriya Kilchytska, G. Pailloncy, Dimitri Lederer, IEEE Electron Device Letters EngineeringBox ThinningSilicon On InsulatorSemiconductor DeviceRf Semiconductor	2007	27
High frequency low noise potentialities of down to 65nm technology nodes MOSFETs G. Dambrine, Daniel Gloria, Patrick Scheerer, HAL (Le Centre pour la Communication Scientifique Directe) Low-power ElectronicsElectrical EngineeringEngineeringRadio FrequencyRf Semiconductor	2005	25
On-Wafer LSNA measurements including dynamic-bias Gustavo Avolio, G. Pailloncy, Dominique Schreurs, EngineeringMeasurementOn-wafer Lsna MeasurementsEducationHigh-frequency Response	2009	24
Next-generation comb generators for accurate modulated measurements Frans Verbeyst, Marc Vanden Bossche, G. Pailloncy EngineeringRadio FrequencyMeasurementEducationSignal Generation	2013	23
Vector two-tone measurements for validation of non-linear microwave FinFET model Giovanni Crupi, Gustavo Avolio, Dominique Schreurs, Microelectronic Engineering Electrical EngineeringEngineeringMeasurementEducationVector Two-tone Measurements	2009	17
Large-Signal Network Analysis Including the Baseband G. Pailloncy, Gustavo Avolio, Maciej Myslinski, IEEE Microwave Magazine Large-signal Network AnalysisWireless CommunicationsSpread SpectrumStatistical Signal ProcessingEngineering	2011	16

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