Y. Nagahama

A 60-ns 4-Mbit CMOS DRAM with built-in selftest function

Takashi Ohsawa, T. Furuyama, Yoshihiro Watanabe et al. · IEEE Journal of Solid-State Circuits · 1987 · 26 citations

Hardware Security, Electrical Engineering, Engineering +11

Oxidized low-density lipoprotein-induced periodontal inflammation is associated with the up-regulation of cyclooxygenase-2 and microsomal prostaglandin synthase 1 in human gingival epithelial cells

Y. Nagahama, Takashi Obama, Michihiko Usui et al. · Biochemical and Biophysical Research Communications · 2011 · 25 citations

Inflammation, Periodontology, Anti-inflammatory +8

High-Performance and Low-Power CMOS Device Technologies Featuring Metal/High-k Gate Stacks with Uniaxial Strained Silicon Channels on (100) and (110) Substrates

Y. Tateshita, J. Wang, K. Nagano et al. · 2006 · 25 citations

Low-power Electronics, Electrical Engineering, Semiconductor Device +11

An experimental 2-bit/cell storage DRAM for macrocell or memory-on-logic application

T. Furuyama, Takashi Ohsawa, Y. Nagahama et al. · IEEE Journal of Solid-State Circuits · 1989 · 25 citations

Cell Array, Non-volatile Memory, Engineering +19

Extreme High-Performance n- and p-MOSFETs Boosted by Dual-Metal/High-k Gate Damascene Process using Top-Cut Dual Stress Liners on (100) Substrates

Satoru Mayuzumi, J. Wang, Shuji Yamakawa et al. · 2007 · 18 citations

Materials Science, Semiconductor Technology, Electrical Engineering +14