Y. Tateshita

5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance

Yorito Sakano, Takahiro Toyoshima, Ryosuke Nakamura et al. · 2020 · 47 citations

Electrical Engineering, Engineering, High Temperature Tolerance +9

A 0.68e-rms Random-Noise 121dB Dynamic-Range Sub-pixel architecture CMOS Image Sensor with LED Flicker Mitigation

S. Iida, Yorito Sakano, Tomohiko Asatsuma et al. · 2018 · 38 citations

Image Sensor, Engineering, Mixed-signal Integrated Circuit +9

Intercalation of lithium in r.f.-sputtered niobium oxide film as electrode material for lithium-ion batteries

Naoaki Kumagai, Y. Tateshita, Yuichi Takatsuka et al. · Journal of Power Sources · 1995 · 27 citations

Materials Science, Engineering, Battery Electrode Materials +13

Novel Channel-Stress Enhancement Technology with eSiGe S/D and Recessed Channel on Damascene Gate Process

J. Wang, Y. Tateshita, Shuji Yamakawa et al. · 2007 · 27 citations

Materials Engineering, Electrical Engineering, Engineering +10

High-Performance and Low-Power CMOS Device Technologies Featuring Metal/High-k Gate Stacks with Uniaxial Strained Silicon Channels on (100) and (110) Substrates

Y. Tateshita, J. Wang, K. Nagano et al. · 2006 · 25 citations

Low-power Electronics, Electrical Engineering, Semiconductor Device +11