L.W. Linholm

Direct measurements of interfacial contact resistance, end contact resistance, and interfacial contact layer uniformity

S.J. Proctor, L.W. Linholm, Jeffrey A. Mazer · IEEE Transactions on Electron Devices · 1983 · 174 citations

Engineering, Mechanical Engineering, Silicon On Insulator +23

An optimized output stage for MOS integrated circuits

L.W. Linholm · IEEE Journal of Solid-State Circuits · 1975 · 156 citations

Electrical Engineering, Physical Design (Electronics), Engineering +14

A direct measurement of interfacial contact resistance

S.J. Proctor, L.W. Linholm · IEEE Electron Device Letters · 1982 · 140 citations

Engineering, Mechanical Engineering, Homogeneous Interfacial Layer +16

Comments on "An optimized output stage for MOS integrated circuits" [with reply]

R.C. Jaeger, L.W. Linholm · IEEE Journal of Solid-State Circuits · 1975 · 86 citations

Electrical Engineering, Physical Design (Electronics), Engineering +13

Test structures for referencing electrical linewidth measurements to silicon lattice parameters using HRTEM

Richard A. Allen, Barbara Anne am Ende, M.W. Cresswell et al. · IEEE Transactions on Semiconductor Manufacturing · 2003 · 24 citations

Engineering, Measurement, Microscopy +22