Statistics
Publications
33
Citations
1.1K
H-Index
18
Active since
1982
Yasuo Ohno is an author at Tokushima University specializing in electrical engineering, semiconductor devices, and engineering.
Publications per year
1982–2014
33
33
Copper gate AlGaN/GaN HEMT with low gate leakage current
Jin‐Ping Ao, Daigo Kikuta, Naotaka Kubota et al. · IEEE Electron Device Letters · 2003 · 74 citations
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