P. Seegebrecht

Efficiency of body biasing in 90-nm CMOS for low-power digital circuits

K. von Arnim, E. Borinski, P. Seegebrecht et al. · IEEE Journal of Solid-State Circuits · 2005 · 56 citations

Low-power Electronics, Electrical Engineering, Low-power Digital Circuits +12

Impact of STI-induced stress, inverse narrow width effect, and statistical V/sub TH/ variations on leakage currents in 120 nm CMOS

C. Pacha, B. Martin, K. von Arnim et al. · 2004 · 53 citations

Device Modeling, Threshold Voltage Model, Electrical Engineering +15

CMOS photodiode with enhanced responsivity for the UV/blue spectral range

A. Ghazi, Horst Zimmermann, P. Seegebrecht · IEEE Transactions on Electron Devices · 2002 · 53 citations

Photonics, Photoelectric Sensor, Engineering +12

Large-area lateral p-i-n photodiode on SOI

Horst Zimmermann, Bernt Müller, Andreas Hammer et al. · IEEE Transactions on Electron Devices · 2002 · 25 citations

Photonics, Electrical Engineering, Photoelectric Sensor +14

Current model considering oxide thickness non-uniformity in a MOS tunnel structure

M. I. Vexler, A. F. Shulekin, Ch. Dieker et al. · Solid-State Electronics · 2001 · 15 citations

Device Modeling, Electrical Engineering, Current Model +13