R. Liu

Visible and ultraviolet Raman scattering studies of Si1−xGex alloys

M. Holtz, W. M. Duncan, Stefan Zollner et al. · Journal of Applied Physics · 2000 · 108 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Theoretical and experimental investigation of ultrathin oxynitrides and the role of nitrogen at the Si–SiO2 interface

Alexander A. Demkov, R. Liu, Xiaodong Zhang et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 30 citations

Natural Sciences, Materials Science, Physics +17

Optoelectronic and microstructure attributes of epitaxial SrTiO3 on Si

S. Myhajlenko, A. Bell, F. A. Ponce et al. · Journal of Applied Physics · 2004 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +17

Ultraviolet-Raman studies of SrTiO3 ultrathin films on Si

L. Hilt Tisinger, R. Liu, J. Kulik et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002 · 19 citations

Natural Sciences, Materials Science, Physics +16

Fabrication and modeling of gigahertz photodetectors in heteroepitaxial Ge-on-Si using a graded buffer layer deposited by low energy plasma enhanced CVD

Robert E. Jones, Shawn Thomas, Sushil Bharatan et al. · 2003 · 15 citations

Engineering, Electrical Engineering, Materials Science +17