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Fabrication and modeling of gigahertz photodetectors in heteroepitaxial Ge-on-Si using a graded buffer layer deposited by low energy plasma enhanced CVD
15
Citations
3
References
2003
Year
Unknown Venue
PhotonicsElectrical EngineeringSemiconductor DeviceEngineeringLow Energy PlasmaPhotodetectorsRf SemiconductorGraded Buffer LayerApplied PhysicsGigahertz PhotodetectorsDark Current DensityPhotonic Integrated CircuitOptoelectronicsCompound SemiconductorDevice Modifications
Photodetectors were fabricated in a heteroepitaxial Ge-on-Si deposited by low energy plasma enhanced CVD. Dark current density of 4.6 nA//spl mu/m, 49 % quantum efficiency, and a -3 dB bandwidth of 3.5 GHz were measured at 1.3 /spl mu/m wavelength and -3 V bias. Numerical simulations predict device modifications can achieve 10 Gbps (/spl cong/ 7 GHz) bandwidth.
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