W. M. Duncan - Concepedia

Author

W. M. Duncan

Texas Instruments (United States)

Also Known As

W. Duncan, W. M. DUNCAN, W. M. Duncan, W.M. DUNCAN, W.M. Duncan, Walter Duncan, Walter M Duncan, Walter M. Duncan

103

Publications

2.1K

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)Analogic (United States)North Carolina State University The University of Texas at Dallas Texas Tech University

About

W. M. Duncan is an author at Texas Instruments (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	35	1.4K
2	Applied Physics	17	31	1.1K
3	Natural Sciences	8	8	288
4	Education	1	1	67
5	Medicine	1	1	175

W. M. Duncan

Publications

1.9K

Citations

H-Index

Page 1

	Year	Citations
Emerging digital micromirror device (DMD) applications Dana Dudley, W. M. Duncan, John Slaughter Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2003	492
Spatial quantization in GaAs–AlGaAs multiple quantum dots Mark A. Reed, R. T. Bate, K. Bradshaw, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena SemiconductorsMaterials SciencePhotonicsPhotoluminescenceEngineering	1986	244
Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor Hal Edwards, Larry Taylor, W. M. Duncan, Journal of Applied Physics Afm MeasurementsEngineeringMicroscopyTuning-fork FeedbackBiomedical Engineering	1997	175
Visible and ultraviolet Raman scattering studies of Si1−xGex alloys M. Holtz, W. M. Duncan, Stefan Zollner, Journal of Applied Physics Optical MaterialsEngineeringOptoelectronic DevicesSilicon On InsulatorSpectroscopic Property	2000	106
Insitu spectral ellipsometry for real-time measurement and control W. M. Duncan, Steven A. Henck Applied Surface Science EngineeringMeasurementCalibrationSpectroscopyOptical Testing	1993	67
Atomic layer epitaxy of GaInP ordered alloy B. T. McDermott, K. Reid, N. A. El-Masry, Applied Physics Letters Materials EngineeringMaterials ScienceIi-vi SemiconductorEngineeringAtomic Layer Epitaxy	1990	67
A comparison of techniques for nondestructive composition measurements in CdZnTe substrates S. P. Tobin, J. Tower, P. W. Norton, Journal of Electronic Materials Materials ScienceMaterials EngineeringElectrical EngineeringIi-vi SemiconductorEngineering	1995	62
Complex Airy analysis of photoreflectance spectra for III-V semiconductors Joseph P. Estrera, W. M. Duncan, R. Glosser Physical review. B, Condensed matter EngineeringComplex Airy FunctionsGradient Electric FieldSpectroscopic PropertySemiconductors	1994	54
Phonon mode study of near-lattice-matched In<i>x</i>Ga1−<i>x</i>As using micro-Raman spectroscopy Joseph P. Estrera, P. D. Stevens, R. Glosser, Applied Physics Letters Optical MaterialsEngineeringRaman FrequenciesGaas-like LoOptoelectronic Devices	1992	49
<title>DLP technolgy: applications in optical networking</title> Lars A. Yoder, W. M. Duncan, E.M. Koontz, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2001	41

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