Hal Edwards

Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor

Hal Edwards, Larry Taylor, W. M. Duncan et al. · Journal of Applied Physics · 1997 · 175 citations

Afm Measurements, Engineering, Microscopy +16

Analyzing atomic force microscopy images using spectral methods

S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 147 citations

Typical Afm, Engineering, Microscopy +16

A quantum-dot refrigerator

Hal Edwards, Qian Niu, Alex de Lozanne · Applied Physics Letters · 1993 · 130 citations

Electronic Fermi–dirac Distribution, Cryogenic Refrigeration Scheme, Engineering +23

Silicon integrated circuit thermoelectric generators with a high specific power generation capacity

Gangyi Hu, Hal Edwards, Seongkwan Mark Lee · Nature Electronics · 2019 · 119 citations

Electrical Engineering, Energy Harvesting, Engineering +14

Scanning capacitance spectroscopy: An analytical technique for pn-junction delineation in Si devices

Hal Edwards, Rudye McGlothlin, Richard San Martin et al. · Applied Physics Letters · 1998 · 116 citations

Engineering, Microscopy, Silicon On Insulator +16