Michiel Vandemaele

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

Michiel Vandemaele, B. Kaczer, Stanislav Tyaginov et al. · 2022 IEEE International Reliability Physics Symposium (IRPS) · 2022 · 21 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the $\{\boldsymbol{V_{G}}, \boldsymbol{V_{D}}\}$ bias space

E. Bury, Adrian Chasin, Michiel Vandemaele et al. · 2019 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability

J. Diaz-Fortuny, P. Sarazá-Canflanca, E. Bury et al. · 2022 IEEE International Reliability Physics Symposium (IRPS) · 2022 · 18 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

A Compact Physics Analytical Model for Hot-Carrier Degradation

Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele et al. · 2020 · 17 citations

Engineering, Electrical Engineering, Materials Science +17

Full ($V_{\mathrm{g}},\ V_{\mathrm{d}}$) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs

Michiel Vandemaele, B. Kaczer, Stanislav Tyaginov et al. · 2019 · 16 citations · Full text

Engineering, Electrical Engineering, Materials Science +17