P. Sarazá-Canflanca

Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits

J. Diaz-Fortuny, P. Sarazá-Canflanca, R. Castro‐López et al. · IEEE Transactions on Instrumentation and Measurement · 2019 · 27 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation

P. Sarazá-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo et al. · Microelectronics Reliability · 2021 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +14

Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation

P. Sarazá-Canflanca, J. Martín-Martínez, R. Castro‐López et al. · IEEE Transactions on Electron Devices · 2021 · 18 citations · Full text

Engineering, Electrical Engineering, Microelectronics +10

A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability

J. Diaz-Fortuny, P. Sarazá-Canflanca, E. Bury et al. · 2022 IEEE International Reliability Physics Symposium (IRPS) · 2022 · 18 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging

A. Santana-Andreo, P. Sarazá-Canflanca, R. Castro‐López et al. · AEU - International Journal of Electronics and Communications · 2024 · 15 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16