P.A. Riggs

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Electrical Engineering, Electronic Materials +15

An SEU hardening approach for high-speed SiGe HBT digital logic

R. Krithivasan, Guofu Niu, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2003 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +17

A comparison of SEU tolerance in high-speed SiGe HBT digital logic designed with multiple circuit architectures

Guofu Niu, R. Krithivasan, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2002 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +17

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2004 · 36 citations

Engineering, Computer Engineering, Electrical Engineering +14