Statistics
Publications
5
Citations
222
H-Index
5
Active since
2003
F. Daugé is an author at Institut de Microélectronique, Electromagnétisme et Photonique specializing in microelectronics, engineering, and electrical engineering.
Publications per year
2003–2005
5
5
Coupling effects and channels separation in FinFETs
F. Daugé, J. Pretet, S. Cristoloveanu et al. · Solid-State Electronics · 2003 · 86 citations
Experimental gate misalignment analysis on double gate SOI MOSFETs
J. Widiez, F. Daugé, M. Vinet et al. · 2005 · 22 citations
Gate Coupling, Electrical Engineering, Gate Misalignment Influence +8
Experimental comparison between double gate, ground plane, and single gate SOI CMOSFETs
J. Lolivier, J. Widiez, A. Vinet et al. · 2004 · 15 citations
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