M. Huhn

Publications

228

Citations

H-Index

2015

Active since

Affiliations

Fraunhofer Institute for Reliability and Microintegration(Current)

Fondazione Bruno Kessler

Technische Universität Berlin

M. Huhn is an author at Fraunhofer Institute for Reliability and Microintegration specializing in microelectronics, engineering, and electrical engineering.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringComputer EngineeringElectromagnetic CompatibilityAntennaMicrofabricationElectronic PackagingMicrowave EngineeringRadio Frequency Micro-electromechanical Systems

Publications per year

2015–2017

Publications

RF-MEMS Technology for 5G: Series and Shunt Attenuator Modules Demonstrated up to 110 GHz

Jacopo Iannacci, M. Huhn, Christian Tschoban et al. · IEEE Electron Device Letters · 2016 · 68 citations

Rf-mems Technology, Electrical Engineering, Millimeter Wave Technology +13

RF-MEMS Technology for Future Mobile and High-Frequency Applications: Reconfigurable 8-Bit Power Attenuator Tested up to 110 GHz

Jacopo Iannacci, M. Huhn, Christian Tschoban et al. · IEEE Electron Device Letters · 2016 · 60 citations

Rf-mems Technology, Engineering, Radio Frequency +16

Development of a Multi-project Fan-Out Wafer Level Packaging Platform

Tanja Braun, S. Raatz, Marius van Dijk et al. · 2017 · 32 citations

Engineering, Computer Architecture, Multi-layer Structure +16

RF-MEMS for 5G mobile communications: A basic attenuator module demonstrated up to 50 GHz

Jacopo Iannacci, Christian Tschoban, Jacob Reyes et al. · 2016 · 30 citations

Rf-mems Technology, Wireless Communications, Engineering +17

Material and process trends for moving from FOWLP to FOPLP

Tanja Braun, S. Voges, Michael J. Topper et al. · 2015 · 23 citations

Materials Science, Advanced Packaging, Electrical Engineering +15

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