E. Barth

A high performance 90nm SOI technology with 0.992 μm/sup 2/ 6T-SRAM cell

Mukesh Khare, S.H. Ku, R. A. Donaton et al. · 2003 · 43 citations

Low-power Electronics, Materials Science, Electrical Engineering +14

A high performance 0.13 μm copper BEOL technology with low-k dielectric

R. Goldblatt, B. Agarwala, M.B. Anand et al. · 2002 · 30 citations

Materials Science, Materials Engineering, Electrical Engineering +14

Specific heat of the two dimensional antiferroelectric squaric acid

E. Barth, Jean‐Jacques Helwig, H. D. Maier et al. · The European Physical Journal B · 1979 · 28 citations

Engineering, Specific Heat, Physics +5

High temperature strength of niobium aluminide intermetallics

E. Barth, J. K. Tien, Satoru UEJO et al. · Materials Science and Engineering A · 1992 · 20 citations

Materials Science, Materials Engineering, Aluminium Nitride +4

Thermal cycle reliability of stacked via structures with copper metallization and an organic low-k dielectric

R. G. Filippi, Jonathon McGrath, T. Shaw et al. · 2004 · 19 citations

Engineering, Mechanical Engineering, Thermal Conductivity +26