Shuji Hamada

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Xijiang Lin, Kun-Han Tsai, Chen Wang et al. · Proceedings - Asian Test Symposium/Proceedings · 2006 · 132 citations

Engineering, Computer Engineering, Electrical Engineering +16

Invisible delay quality - SDQM model lights up what could not be seen

Yasuo Satô, Shuji Hamada, Toshiyuki Maeda et al. · 2006 · 120 citations

Engineering, Computer Engineering, Digital Design +17

Evaluation of the statistical delay quality model

Yasuo Satô, Shuji Hamada, Toshiyuki Maeda et al. · 2005 · 49 citations

Engineering, Computer Engineering, Microelectronics +15

Evaluation of the statistical delay quality model

Y. Sato, Shuji Hamada, Toshiyuki Maeda et al. · Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. · 2005 · 32 citations

Engineering, Computer Engineering, Microelectronics +15

A Framework of High-quality Transition Fault ATPG for Scan Circuits

Seiji Kajihara, Shohei Morishima, Akane Takuma et al. · Proceedings/Proceedings - International Test Conference · 2006 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +15