Statistics
Publications
5
Citations
244
H-Index
5
Active since
2009
L. Scotti is an author at STMicroelectronics (Italy) specializing in computer engineering, electrical engineering, and computer architecture.
Publications per year
2009–2022
5
5
BEOL Process Effects on ePCM Reliability
Andrea Redaelli, A. Gandolfo, G. Samanni et al. · IEEE Journal of the Electron Devices Society · 2022 · 12 citations · Full text
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