M. Kittler

Recombination activity of contaminated dislocations in silicon: A model describing electron-beam-induced current contrast behavior

V. V. Kveder, M. Kittler, W. Schröter · Physical review. B, Condensed matter · 2001 · 243 citations

Natural Sciences, Materials Engineering, Materials Science +17

Germanium tin: silicon photonics toward the mid-infrared [Invited]

E. Kasper, M. Kittler, Michael Oehme et al. · Photonics Research · 2013 · 137 citations

Engineering, Materials Engineering, Materials Science +17

Low threading dislocation density Ge deposited on Si (100) using RPCVD

Y. Yamamoto, P. Zaumseil, T. Arguirov et al. · Solid-State Electronics · 2011 · 132 citations

Natural Sciences, Materials Engineering, Materials Science +12

Influence of copper contamination on recombination activity of misfit dislocations in SiGe/Si epilayers: Temperature dependence of activity as a marker characterizing the contamination level

M. Kittler, C. Ulhaq-Bouillet, V. Higgs · Journal of Applied Physics · 1995 · 89 citations

Engineering, Materials Engineering, Materials Science +17

GeSn Heterojunction LEDs on Si Substrates

Michael Oehme, Konrad Kostecki, T. Arguirov et al. · IEEE Photonics Technology Letters · 2014 · 88 citations

Engineering, Electrical Engineering, Materials Science +17