C. Ulhaq-Bouillet

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Active since

1995

Affiliations

Leibniz Institute for High Performance Microelectronics(Current)

C. Ulhaq-Bouillet is an author at Leibniz Institute for High Performance Microelectronics specializing in temperature dependence, metal contamination, and trap levels.

Publications per year

1995–1995

Publications

Influence of copper contamination on recombination activity of misfit dislocations in SiGe/Si epilayers: Temperature dependence of activity as a marker characterizing the contamination level

M. Kittler, C. Ulhaq-Bouillet, V. Higgs · Journal of Applied Physics · 1995 · 89 citations

Engineering, Materials Engineering, Materials Science +17

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