G. Bidal

A New Technique to Extract the Source/Drain Series Resistance of MOSFETs

D. Fleury, A. Cros, G. Bidal et al. · IEEE Electron Device Letters · 2009 · 64 citations

Engineering, Electrical Engineering, Impurity Profiling +11

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

S. Haendler, C. Leyris, G. Bidal et al. · IEEE Transactions on Electron Devices · 2011 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +17

First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration

Dominique Golanski, P. Fonteneau, C. Fenouillet-Béranger et al. · 2013 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +14

Thin-film devices for low power applications

S. Monfray, C. Fenouillet-Béranger, G. Bidal et al. · Solid-State Electronics · 2009 · 28 citations · Full text

Natural Sciences, Electrical Engineering, Materials Science +11

Gate-all-around technology: Taking advantage of ballistic transport?

J.-L. Huguenin, G. Bidal, S. Denorme et al. · Solid-State Electronics · 2010 · 22 citations

Engineering, Electrical Engineering, Semiconductor Devices +9