H. Balachandran

K longest paths per gate (KLPG) test generation for scan-based sequential circuits

Wangqi Qiu, Jing Wang, D.M.H. Walker et al. · 2004 · 117 citations

Engineering, Computer Engineering, Computer Science +15

REDO-random excitation and deterministic observation-first commercial experiment

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak et al. · 2003 · 116 citations

Engineering, Computer Engineering, Electrical Engineering +17

Clustering based techniques for I/sub DDQ/ testing

S. Jandhyala, H. Balachandran, Anura P. Jayasumana · 2003 · 53 citations

Engineering, Computer Engineering, Computer Systems +11

On applying non-classical defect models to automated diagnosis

J. Saxena, Kenneth M. Butler, H. Balachandran et al. · 2002 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +16

Facilitating rapid first silicon debug

H. Balachandran, Kenneth M. Butler, Neil Simpson · 2003 · 26 citations

Engineering, Computer Engineering, Design +12