Sooryong Lee

REDO-random excitation and deterministic observation-first commercial experiment

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak et al. · 2003 · 116 citations

Engineering, Computer Engineering, Electrical Engineering +17

Adversarial Defect Detection in Semiconductor Manufacturing Process

Jaehoon Kim, Yunhyoung Nam, Min-Cheol Kang et al. · IEEE Transactions on Semiconductor Manufacturing · 2021 · 45 citations

Computing, Computer Engineering, Computer Science +16

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults

Sooryong Lee, B. Cobb, Jennifer Dworak et al. · Design, Automation, and Test in Europe · 2002 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +13

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee et al. · 2002 · 34 citations

Computing, Computer Engineering, Electrical Engineering +10

The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space

Dmitry Vengertsev, Seung-Hune Yang, Seongbo Shim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 22 citations

Engineering, Computer Science, Manufacturing Engineering +11