Jam-Wem Lee

5nm-gate nanowire FinFET

Fu-Liang Yang, Di-Hong Lee, Hou-Yu Chen et al. · 2004 · 248 citations

Device Modeling, Electrical Engineering, Engineering +13

Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Chih‐Yang Chen, Jam-Wem Lee, Shen-De Wang et al. · IEEE Transactions on Electron Devices · 2006 · 123 citations

Materials Engineering, Stress Voltage, Electrical Engineering +12

High-k metal gate-bounded Silicon Controlled Rectifier for ESD protection

Tzu-Heng Chang, Yuying Hsu, Tsung-Che Tsai et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2012 · 22 citations

Hardware Security, Low-power Electronics, Electrical Engineering +12

A Reliability Model for Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Chih‐Yang Chen, Jam-Wem Lee, Po-Hao Lee et al. · IEEE Electron Device Letters · 2007 · 17 citations

Electrical Engineering, Ltps Tfts, Engineering +13

Bias Temperature Instabilities for Low-Temperature Polycrystalline Silicon Complementary Thin-Film Transistors

Chih‐Yang Chen, Jam-Wem Lee, Ming-Wen Ma et al. · Journal of The Electrochemical Society · 2007 · 16 citations

Electrical Engineering, Engineering, Physics +12