Po-Hao Lee

16.4 An 89TOPS/W and 16.3TOPS/mm² All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications

Yu-Der Chih, Po-Hao Lee, Hidehiro Fujiwara et al. · 2021 · 335 citations

Computing, Computer Engineering, Computer Science +17

Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Chih‐Yang Chen, Jam-Wem Lee, Shen-De Wang et al. · IEEE Transactions on Electron Devices · 2006 · 123 citations

Engineering, Electrical Engineering, Materials Science +17

13.3 A 22nm 32Mb Embedded STT-MRAM with 10ns Read Speed, 1M Cycle Write Endurance, 10 Years Retention at 150°C and High Immunity to Magnetic Field Interference

Yu-Der Chih, Yi-Chun Shih, Chia-Fu Lee et al. · 2020 · 93 citations

Engineering, Computer Engineering, Electrical Engineering +9

22nm STT-MRAM for Reflow and Automotive Uses with High Yield, Reliability, and Magnetic Immunity and with Performance and Shielding Options

W. J. Gallagher, Eric Chien, Tien-Wei Chiang et al. · 2019 · 81 citations

Engineering, Computer Engineering, Electrical Engineering +14

33.1 A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity

Po-Hao Lee, Chia-Fu Lee, Yi-Chun Shih et al. · 2023 · 58 citations

Engineering, Computer Engineering, Electrical Engineering +17